Analizador de Redes Multipuerta y su Aplicación a la Caracterización de Materiales Quirales

Abstract

A multiport network analyzer using fixed electric probes for characterizing chiral materials is proposed. The system is based on a previous five-port junction and modified by adding a new probe in the perpendicular plane. The new dual 5-port allows measuring the reflection coefficient and the two polar transmission coefficients (for polarization parallel and perpendicular to incident wave). The theory of five-port analyzer network is revisited and the modifications for chiral measurement are presented. The first results of the rotation angle produced by different structures are also presented and a comparison with the results obtained with a conventional system is shown.